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MAY-JUNE 2026

Unless stated all prices exclude vat & delivery        call or email for prices and quotations


  MICROSCOPES PLUS LTD - 72 Brookside South, Barnet, EN4 8LW    TEL: 0333 444 1950    E: info@microscopesplus.co.uk                 

  Registered in England REG No: 2929803 @ 72 Brookside South,  Barnet,   EN4 8LW        VAT No GB-64 606: 57 29  

  Pictures used are from the manufacturer with their consent or are original images owned by MPL.   .Companies represented are ISO 9001 compliant . All  products are CE certified.                                       

 Copyright 2026 Microscopes Plus Ltd.

                                                                                                      

   

MPL SERVICING APPLICATION MICROSCOPES CAMERAS ILLUMINATION ACCESSORIES OFFERS/REFURB





PA53 MET-BD LED

The PA53 MET Series are superior solutions for industrial quality control and analysis of opaque materials.

Crisp and clear images are guaranteed thanks to the newly designed Semi-Apochromatic Brightfield and Darkfield objectives.

The eyepieces have a 25mm FOV, ahead of any standard.

The powerful 10W LED illumination features the ECO Function, a power-saving mode.

The quintuple coded nosepiece recalls the last light intensity used for a smoother workflow.

The incident illumination provides a variety of Contrast Methods: Brightfield and Darkfield are the standards, DIC is a powerful optional tool for the visualization of scratches or other tiny surface defects of opaque samples.


PA53 MET-BD-T-3D

The PA53MET BD-T-3D stands out for being an automated digital microscope for 3D image acquisition through a motorized Z-axis.

 Accurate 3D measurements of simple dimensions, deeps, and volumes are provided by capturing a stack of 2D images through the Z-axis profiler combined with Motic’s Analysis Software.

The PA53 MET Series are superior solutions for industrial quality control and analysis of opaque materials.

Crisp and clear images are guaranteed thanks to the newly designed Semi-Apochromatic Brightfield and Darkfield objectives.

The incident illumination provides a variety of Contrast Methods: Brightfield and Darkfield are the standards, DIC is a powerful optional tool for the visualization of scratches or other tiny surface defects of opaque samples.






























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